摘要
输出电压是DC/DC芯片测试中的重要参数之一,输出电压不确定度可根据DC/DC芯片测试系统的系统模型和其它影响因素构建的数学模型计算得出。依据建立的数学模型,结合各不确定度实测数据和校验报告数据,可计算得出输出电压的测试标准不确定度和扩展不确定度。
The output voltage is one of the important parameters in DC/DC chip test, and the test uncertainty of the output voltage could be calculated by the mathematical model established with the DC/DC chip test system model and other effects. The standard uncertainty and the expanded uncertainty could be calculated with uncertainty of measured data and the report data based on the mathematical model.
出处
《工业技术创新》
2014年第2期202-204,共3页
Industrial Technology Innovation
