摘要
工艺技术进入微米级之后,放射性粒子引起的电路软错误率不断升高,现有加固技术通常会带来较大的面积开销。为了平衡电路面积开销和可靠性,提出了一种新的电路加固平衡指标AF,并基于二分查找替换算法,将电路中的敏感寄存器替换为三模冗余寄存器来有效容忍电路中的软错误。实验结果表明,方案可以使电路平均故障间隔时间(MTBF)平均增加为原来的181.37%,显著地提高了电路的可靠性。在同样的实验条件下,与其他方案相比,提出的方案能获得更小AF值。
Since technology size has gone into the micron order , the digital circuit soft error problems caused by ra-diation are constantly increasing.However, the existing circuit hardening technology could bring along serious area overhead.To balance the circuit area overhead and reliability, a new circuit hardening balance metrics AF is described in this paper.By using binary search replacement algorithm , the susceptible registers in the circuit are replaced by a triple modular redundancy register.According to the experimental results, the proposed scheme can increase the circuit mean time between failures （ MTBF） in 181.37% in average, which dramatically improves the circuit reliability.Compared with other methods under the same experimental conditions, the proposed scheme can get smaller AF.
出处
《电子测量与仪器学报》
CSCD
2014年第7期736-741,共6页
Journal of Electronic Measurement and Instrumentation
基金
国家自然科学基金(61274036
61106038
61106020)
博士点基金(20110111120012)资助项目
关键词
软错误
可靠性
选择性加固
二分查找算法
soft error
reliability
selective hardening
binary search algorithm
