摘要
对高强度及高模量的PAN基碳纤维进行了不同温度下的高温X射线衍射在位测试 ,根据X射线衍射测试结果 ,给出了SP2 杂化的碳原子层面内的C—C原子键距a0 以及乱层层面间距d0 0 2 随温度的变化规律 。
PAN-based carbon fibers of high stuength and high modulus are meusurd using high-temperature in situ X-ray diffraction,the changing relations of C--C bond length(a 0) on hexagonal carbon layer and interlayer spacing(d 002 ) of turbostatic structure with temperature are given,and the relations between the changing reules and valence electronic structure are discussed in the present work.
出处
《松辽学刊（自然科学版）》
2002年第2期1-3,共3页
Songliao Journal (Natural Science Edition)
基金
四平市科委资助项目
关键词
PAN基碳纤维
价电子结构
XRD在位测试
PAN-based carbon fibers,valence electronic structure,In situ XRD measure.
