摘要
本文讨论掺Nd的MnBi薄膜的结构,磁性和磁光性能。由X射线衍射和Auger谱分析表明,经适当热处理后,形成以MnBi为主的晶格结构,发现Nd掺入后可能存在MnBiNd合金的衍射线,并按NiAs型结构计算其晶格常数:a=4.14,Ac=5.80A。转矩曲线和磁滞廻线结果给出薄膜具有很好的垂直膜面各向异性,当投料量Mn/Bi的值在2左右时,可得到合适的σ_s,适当的H_c值(1—4kOe),以及较大的Kerr转角为θ_k(1.5—2°)。磁光谱表明,θ_k极大值对应的频率随Nd的掺入量增加而移向低频端。实验发现,采用冷却衬底方法制备的薄膜,可使晶粒大小在200—400A范围,而Nd的加入避免了MnBi合金高温相的出现。
In this paper the structure, magnetic and magneto-optical properties of the Nd-doped MnBi thin films are discussed. The analyses by the Auger profile and X-ray diffraction of these films show that the crystal structure composed mainly of MnBi hop is formed after suitable annealing, and the structure of MnBiNd alloy which is much similar to the MnBi may be existed for the MnBi films doped with Nd. According to the crystal structure with NiAs type the lattice constants of MnBiNd alloy are calculated: a = 4.14A, c = 5.80A. The torque curve and the hysteresis loop show that the film possesses perpendicular anisotropy. When the ratio of raw materials Mn/Bi is two or so, we can obtain the suitable as, the proper H_c (1-4 kOe), and a very large Kerr rotation angle θK (1.5-2°). The magneto-optical profile shows that the frequency corresponding to the maximum θ_k shifts to low frequency as Nd component increases .It was found that the grain size of all films which were deposited on the cooled glass substrates is limited in the range of 200 to 400A, moreover, the high temperature phase transition of MnBi alloy was avoided by Nd doping.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
1991年第5期833-843,共11页
Acta Physica Sinica
基金
国家自然科学基金
中国科学院物理研究所磁学开放研究实验室资助的课题
