摘要
通过简化半导体器件灵敏单元 ,计算得到了宇宙高能质子在器件灵敏单元内产生的能量沉积。然后利用地面重离子实验单粒子翻转数据得到的Weibull函数 ,计算了CRRES卫星轨道、 33mm铝屏蔽壳体内几种器件的单粒子翻转率 ,并与已有结果进行了比较说明。
By simplifying the sensible volume of semiconductor devices, the energy deposited by the cosmic highenergy protons in the sensible volume of semiconductor devices is calculated. Then by using the Weibull function derived by the ground heavy ion SEU experiments, the SEU rates of several devices by the shielding of 33 mm Aluminum in the CRRRES satellite orbit are calculated. The results are compared and analyzed.
出处
《国防科技大学学报》
EI
CAS
CSCD
北大核心
2002年第2期11-13,共3页
Journal of National University of Defense Technology
基金
国家部委基金项目资助 (98J11 2 2 KG0 12 6)
