摘要
采用在多孔载体上预投分子筛晶种 ,再用水热晶化的二次生长的成膜方法合成X型分子筛膜。通过三次晶化操作 ,SEM显示多孔载体上负载生长的分子筛膜厚约 1 5μm。分子筛膜的He和N2 的渗透率下降为载体渗透率的 1 %以下 ,纯三丁胺与全氟三丁胺的渗透率之比为 2 1 ( 3 50℃ )。但表征结果显示 ,膜层内存在缺陷。本研究采用了化学沉积与积炭处理相结合的二步修饰法来消除缺陷。结果表明 ,经二步修饰后 ,X型分子筛膜用三丁胺和全氟三丁胺的蒸气测试其渗透率 ,发现渗透侧全氟三丁胺几乎收集不到 ,比未修饰的膜的渗透率有很大提高 ,说明修饰对X型分子筛膜的非沸石孔道的消除很明显。
Zeolite X membranes had been investigated by secondary growth on ceramic cylinders with pores of 100-200nm precoated with zeolite X seeds. SEM showed that there existed a zeolite top layer with a thickness about 15μm on the inner surface of the supports after three syntheses. The permeability of helium and nitrogen through the zeolite X membrane usually decreased to less than 1.0% of that of the original cermic supports, the permeability ratio of tri n butylamine to perfluro tributylamine reached 21 under 350 ℃. The characterization exhibited that there existed the defects in the zeolite membrane. An improved method, chemical deposit succeeded with carbon deposition treatment, had been employed to eliminate the defects. Tri n butylamine and perfluro tributylamine were used to test the permeable performance after treatment. It was observed that nearly no effluent of perfluro tributylamine appeared, which indicated that the non zeolite channels in zeolite X membrane were obviously removed.
出处
《石油炼制与化工》
CAS
CSCD
北大核心
2001年第9期43-48,共6页
Petroleum Processing and Petrochemicals
关键词
X型分子筛膜
制备
沉积
积炭
渗透性
zeolite
membrane
preparation
deposit
carbon deposit
permeability
