摘要
介绍了用ｓｈｉｆｒｉｎ变换反演粒径分布的新方法及相应的测试装置，对几微米以上几种样品较径的测试实验表明，该法可测得较目前直方图分布更为详细的粒径连续分布，对峰值粒径的测量也有更高的精度，同时仅需要很少的预知信息。
A new method of inversing particle-size distribution using the shifrin-transform and its experimental apparatus are introduced in this paper. It is showed by the experimental measurements of several samples for particle size of several microns about that the size continuous distributions obtained by the method are more detailed than histogram distribution. The precision of measurements for peak value of particle diameter is higher. In addition, the method only requires a minimum of a prior information.
出处
《南通工学院学报》
2001年第2期18-21,共4页
Journal of Nantong Institute of Technology
基金
南通工学院自然科学基金资助项目
