摘要
用磁控溅射的方法制备得到 Fe XCu1-X纳米颗粒膜 ,并系统研究了它的 R- I特性 (电阻 -电流特性 ) .实验发现随着纳米颗粒膜的厚度、铁铜含量比和退火条件的改变 ,R- I特性将发生明显的变化 ,表明测量电流的大小对纳米颗粒膜的结构和性质有不可忽视的影响 .基于较大测量电流导致的阻温特性和薄膜的部分晶化效应 。
A series of Fe xCu 1 x granular films were fabricated by rf magnetron sputtering and the R I (resistant current) relation was studied systematically. This relation changed with the thickness of the film, the atom ratio x of iron to copper and the annealing conditions. The experiment shows that even a small measuring current also affects the structure and properties of the nano size granular film seriously. As a result of big current measurment, the film exhibits an anomalous resistance temperature characteristic and the structure of the film crystallizes partly. A preliminary explanation is given to the experimental phenomena.
出处
《浙江大学学报（理学版）》
CAS
CSCD
2001年第3期258-262,共5页
Journal of Zhejiang University（Science Edition）
基金
浙江省自然科学基金资助项目!(1990 31)
