摘要
讨论利用红外显微测温仪测量物体微小表面真实温度的方法。通过分析测量 目标大小，响应波长范围和物体表面发射率对红外探测器响应特性的影响．提出计算非 黑体表面真实温度的表达式，并且得到满意的实验验证。利用该红外系统成功地测量了 微波功率管芯片表面的发射率分布以及在直流热耗散下芯片结区的温度分布，计算了峰 值热阻和平均热阻，为微波功率管的热设计提供了实验依据。
The method for true temperature measurement for a small target by using an infra-red microscopic thermometer is discussed. The effect of the size of the measured object, the wavelength range and the surface emissivity on the response behavior of the infra-red detector was analysed. The expression of calculation of the true temperature of a non--black body surface is given and rerified by experimental results. The surface emissivity distribution of a microwave power transistor and the temperature distribution of a chip with power dissipation are measured with this infrared system, and the peak thermal resistance and the average thermal resistance are determined. All of these provide a good basis for the thermal design of microwave power transistors.
出处
《清华大学学报（自然科学版）》
EI
CAS
CSCD
北大核心
1990年第2期92-99,共8页
Journal of Tsinghua University(Science and Technology)
关键词
温度测量
表面真实温度
红外测温仪
微波功率管
热阻
微小物体
temperature measurement, surface true temperature, infrared microscopic thermometer, microwave power transistor, thermal resistance
