摘要
用磁控溅射法制备了不同Cr插层厚度的Co/Cr/Pd系列多层膜样品 .通过X射线衍射对该多层膜进行了结构分析 ;通过测定不同Cr层厚度多层膜的磁力图、磁滞回线 ,分析了垂直各向异性Ku 和矫顽力变化的原因 ;通过测定该多层膜体系的克尔谱及椭偏率谱 ,分析了克尔角变化的机理 。
A series of Co/Cr/Pd modulated multilayers with Cr layer thickness X-Cr ranging from 0 to 1.13 nm have been prepared by magnetron sputtering system on 40 nm thick Pd buffer. With combimed small- and large-angle X-ray analyses, the layered and crystal structure of the samples were investigated. The magnetic hysteresis loops and domain structure were perpendicular magnetic anisotropy and the coercivity of the multilayers decrease with the increase of Cr thickness,which was ascribed to the reduction of the polarization of Pd atoms and the interlayer roughness, respectively. The Kerr rotation and ellipticity of the multilayers were also studied. The decrease of Kerr rotation with the increase of the Cr thickness was assumed to be due to the decrease of the polarization of Pd atoms.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
2001年第1期159-163,共5页
Acta Physica Sinica
基金
国家自然科学基金!(批准号 :197740 72 )资助的课题&&
关键词
多层膜
磁性
磁光特性
multilayers
magnetic
magneto-optical
