摘要
提出了一种新颖的二维纠错码电路,可以有效地抑制辐射引起的存储器多位翻转。提出设计方法的最大特点是可以修正任意指定宽度的多位翻转,并以较低的硬件开销确保存储器的高可靠性。首先,本文提出一种新颖的二维修正码:把一个存储器的字拆分成一个二维矩阵的形式,分别对每一行和每一列加入多位错误探测码和奇偶校验码。随后,设计了存储器多位翻转的修正算法。最后,对提出的方法进行了电路和版图设计,并且利用提出的版图分割法解决了二维修正码冗余位中可能出现的多位翻转,进一步提高了存储器的可靠性。实验结果表明,提出的存储加固设计方法具有更高的可靠性。同目前已知的多位修正码相比,具有更低的编码和译码硬件开销,甚至低于只有一位修正能力的汉明码。
A novel two-dimensional error codes correction circuit which can effectively mitigate radiation-induced MBU in memory is proposed in this paper. The key features of the proposed method are that it can correct MBU with any possible width and assure the reliability of memory with very low cost overhead. Firstly, the proposed two-dinlensional error codes are constructed in the paper. A word in memory is transformed to a matrix form. Low complexity muhibit error detection codes are applied in each row for error detection while parity codes are applied in each column for error correction. Then, the correction algorithm of memory against MBU is proposed in the paper. Finally, the circuit and its layout design of the proposed method are implemented. A method called layout partition is proposed to mitigate MBU in the redundancy bits of the two-dimensional error correction code to further improve the reliability of memory. The experimental results reveal that the proposed method has a higher reliability. Compared with the existing multibit error correction codes, it has lower encoding and decoding overheads, even for Hamming codes.
出处
《宇航学报》
EI
CAS
CSCD
北大核心
2014年第2期227-234,共8页
Journal of Astronautics
基金
哈尔滨市科技创新人才研究专项资金项目(抗多位翻转存储器加固技术研究
2012RFXXG042)
关键词
存储器
抗辐射加固
纠错码
二维纠错码
多位翻转
Memory
Radiation hardened
Error correction code
Two-dimensional error correction codes
Multiple bit upsets （MBU）
