摘要
在1 500℃条件下,通过掺杂质量分数为0、0.6%及1.5%的MgO制备了T1、T3及M3型硅酸三钙(C3S)。使用不同分辨率的X射线衍射仪对样品进行分析。结果表明:不同晶型的C3S指纹区X射线粉末衍射特征峰存在明显差异,衍射峰的不同可以用于判定C3S晶型;当X射线衍射仪分辨率较低(仪器半高宽≥0.129°)且存在Ka2时,得到的C3S衍射峰特征不明显,存在重叠现象,无法判定C3S晶型;使用高分辨率衍射仪(仪器半高宽≤0.072°),无Ka2影响下,得到的衍射峰清晰,可以对C3S晶型进行精确判定。
T1, T3 and M3 polymorphs of the tricalcium silicate （C3S） were prepared at 1 500℃ v/a doping of MgO at 0, 0. 6% and 1.5% （mass fraction}. The diffraction data of the samples were obtained by X-ray diffractometer with different resolutions. The results show that the fingerprint patterns of the X-ray powder diffraction for the C3S polymorphs are identical, which can be used to investigate the polyrnorphism of C3S. The diffraction peaks for C3S polymorphs are broadened and vague, and some peaks are overlapped under the measurement condition of a lower resolution （full width at half maximum （FWHM） 0. 129°） and Ka2 radiation. When the data are collected at a higher resolution （FWHM≤0. 072°） without Ka2, the patterns are identical to distinguish the polymorphism of C3 S.
出处
《硅酸盐学报》
EI
CAS
CSCD
北大核心
2014年第2期178-183,共6页
Journal of The Chinese Ceramic Society
基金
国家"973"计划(2009CB623100)
江苏高校优势学科建设工程(PAPD)
长江学者和创新团队发展计划(IRT1146)资助项目
关键词
硅酸三钙
多晶型
X射线衍射
分辨率
特征衍射峰
tricalcium silicate
polymorphism
X-ray diffraction
resolution
characteristic pattern
