摘要
本法取20mg 铌钽、稀土单矿物样品,采用熔融、压薄样法,克服矿物效应和减少用样量,以 Mo Kα、Mo KαⅡ线作内标,控制制样与测量精度,采用透空照射法,降低散射背景与痕量元素的检测限,直接提供26个元素的分析数据,方法简便、快速、具有良好的精密度和准确度。
A rapid and simple method for the determination of major and trace elements in nioblum-tantalum and rare earth minerals by XRF was studied.A sample of only 20 mg was fused and pressed to a thin disc.The Mo K_αⅠ and MoK_αⅡ were used as internal standard to control the procedure of sample preparations and measurements.The transmi- ssion method was used to reduce the background scattering intensity and the detection limits of trace elements.The results of 26 elements were satisfactory.
出处
《分析化学》
SCIE
EI
CAS
CSCD
北大核心
1991年第5期560-563,共4页
Chinese Journal of Analytical Chemistry
关键词
X-射线
荧光光谱
矿物
铌钽矿
稀土
X-Ray fluorescence spectrometry
Thin sample method
Transmission method
Niobium-tantalum mineral
Rare earth
