期刊文献+

基于TDR测量和仿真的芯片封装建模方法

A chip package modeling method by combining TDR measurement and simulation
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摘要 文中提出一种TDR时域测量和MMTL建模仿真相结合的建模方法,能精确地对芯片内部以及外部接口传输线建模。克服了芯片内部无法探测的问题,具有直观便于优化的特点,实验结果表明,这种建模方法可以通过不断修正和拟合的方法达到测量和仿真较高的吻合度。 In this paper, a new chip package rriodeling method which combines time domain TDR measurement and multi-segment multiple transmission line model simulation was proposed. The method overcomes the chip internally probing problem, with characteristics of intuitive and easy to optimization. The experimental results show that the modeling method achieves accurate fitting through continuous modification and fitting method by iterating between measurement and simulation.
作者 李牛
出处 《信息技术》 2013年第10期139-140,144,共3页 Information Technology
关键词 TDR 时域测量 芯片建模 MMTL Key time domain reflector (TDR) time domain measurement chip package modeling multi-segment multiple transmission line
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参考文献3

  • 1Madhavan Swaminathan, A. Ege Engin. Power Integrity Modeling and Design for Semiconductors and Systems[ Z3. 2007. 被引量:1
  • 2Howard Johnson, Martin Graham. High-Speed signal propagation [Z]. 2003. 被引量:1
  • 3Stephen H Hall,Garrett W HaU,James A McCall. High-Speed Digit- al SystemDesign--A Handbook of Interconnect Theory and Design Practiees[Z]. 2000. 被引量:1

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