摘要
依据原子力显微镜(AFM)微颗粒探针克服了AFM普通探针的诸多局限性及其对测试环境无要求,且能定量测定微颗粒探针与膜及污染物间的相互作用力及其变化等特点,在AFM微颗粒探针制备技术的发展及其在分离膜中的应用研究动向的基础上,详细讨论了AFM微颗粒探针的制备方法及其在膜的有机物污染研究中的具体应用,提出了AFM微颗粒探针在分离膜的有机物污染机制解析中亟待研究的问题,为科学地分析分离膜有机物污染机制及分离膜的工程设计与运行提供新的思路和途径。
Atomic force microscope （AFM） microsphere probe, which has earned many attentions due to its ability to quantify foulant-foulant and foulant-membrane forces under many environments, is becoming an effective tool in the field of membrane technology. The existing literatures on the preparation technology of AFM microsphere probe and its applications in the membrane organic fouling are summarized, the future research needs are identified. Which would provide new ideas and approaches to scientific analysis of separation membrane organic fouling mechanism and its engineering design and operation.
出处
《材料导报》
EI
CAS
CSCD
北大核心
2013年第13期113-117,共5页
Materials Reports
基金
国家自然科学基金(51278408
51178378)
