摘要
针对基于加速模型参数不变、基于统计方法及基于试验观察3种常见的失效机理一致性检验方法进行研究,发现3种方法均需要加速试验数据来对失效机理一致性进行检验,不能事先为加速试验提供理论指导;提出了一种基于灰色理论的失效机理一致性检验方法,该方法可用预试验数据进行失效机理一致性检验,为加速试验制定最高应力台阶提供理论指导;结合某型光电编码器预试验数据对该方法进行实例验证,得出175℃附近为失效机理变化点,并与基于统计的方法进行对比;最后,对产品进行失效机理分析,利用扫描电镜分析(SEM,Scanning Electron Microscope)结果验证该方法的正确性.
A study was made on the consistency identification method of failure mechanism.Three common methods based on the acceleration model parameters unchanged,based on the statistical methods and based on the experimental observation were studied.It was found that the three methods need the accelerated test data for the consistency identification method of failure mechanism,but this could not provide theoretical guidance for the accelerated test.A consistency identification method of failure mechanism based on grey theory was put forward,which can be used for failure mechanism consistency identification by the pre-test data.Combined with the pre-test data of a certain type of photoelectric encoder,the conclusion was drawn that 175℃° was the change point of the failure mechanism using this method.It made a contrast with the method based on statistical.Finally,the failure mechanism analysis for the products was used to verify the correctness of the method.
出处
《北京航空航天大学学报》
EI
CAS
CSCD
北大核心
2013年第6期734-738,744,共6页
Journal of Beijing University of Aeronautics and Astronautics
关键词
灰色理论
失效机理
一致性检验方法
发光二极管
光敏三极管
grey theory
failure mechanism
consistency identification method
light-emitting diode
phototransistor
