摘要
介绍了瞬态传导骚扰的形成机理、危害及几种常用的测试方法,并综合其他研究人员的成果和自身经验对瞬态传导骚扰提出了相应的抑制措施,希望能对从事相关技术研究的电子产品设计者和电磁兼容工程师有所帮助。
Formation mechanism, electromagnetic interference damage and common test methods of transient conducted emission are introduced. Base on other researchers ＇and authors ＇working experience, some suppression measures of transient conducted emission are proposed to help electronic designers and EMC engineers research on the related techniques.
出处
《电子产品可靠性与环境试验》
2013年第2期22-25,共4页
Electronic Product Reliability and Environmental Testing
关键词
感性器具负载
瞬态传导骚扰
抑制技术
软开关
inductive appliance load
transient conducted emission
suppression techniques
soft switching
