摘要
副瓣电平是天线的重要技术指标之一,较低的副瓣电平可以减弱杂波影响、提高雷达的抗干扰能力。但在实际设计天线的过程中,不可避免的会引入随机误差,使得阵列的口径分布发生变化,直接影响天线阵的性能。随机误差的引入最终都可以表现为阵列各个单元的幅度误差和相位误差,故需要分析随机幅相误差对阵列天线副瓣电平的影响。本文以此出发,应用统计学理论,得到计入随机幅相误差后阵列副瓣区副瓣电平的统计特性,并由此分析在整个副瓣区域内最高副瓣电平的统计特性。结合计算机仿真,证明分析计算结果的正确性。
Side-lobe level is one of the important technical specifications in antenna design. Lower side-lobe is not only helpful for reducing impact of clutter but can also improve anti-jamming performance of radar. However, ran- dom error is inevitable in antenna design, which would change the aperture distribution of antenna array and direct- ly affect performance of the array. The random errors finally show as amplitude-phase errors of elements in the ar- ray; therefore analyzing impact of random amplitude-phase errors on side-lobe level of array is very necessary. Based on statistic theory, statistical characteristic of linear array pattern＇ s side-lobe with random amplitude-phase errors is obtained. Through analyzing statistical characteristic of the maximum side-lobe level in the whole side-lobe zone and by combining with computer simulation, correctness of the analysis result is verified.
出处
《火控雷达技术》
2013年第1期87-93,共7页
Fire Control Radar Technology
关键词
副瓣电平
低副瓣
随机幅相误差
最高副瓣电平
side-lobe level
low side-lobe
random amplitude-phase error
maximum side-lobe level
