摘要
针对某测试系统在试验、调试的过程中,其FPGA控制芯片工作失常,芯片急剧发热的现象进行了深入分析,发现在上电过程中,信号采集电路中FPGA芯片的3.3V和1.2V电源信号出现的多次异常抖动导致了FPGA芯片不能正常工作;因此,文中对FPGA芯片供电电源的可靠性进行了分析,提出了两种解决方案,通过改变LM317可调节端电容、稳压电路输出端减小高频噪声和改善负载电路瞬态响应的电容容值来起到提高供电电源可靠性的作用,并对这两种方案进行了验证。
To deeply analysis on a FPGA integrated circuits of a test system can not work properly and the phenomenon of chip temperature is getting hotter and hotter in the process of testing and debugging. We find that more times jitter of 3.3V and 1.2V power signal of FPGA integrated circuits leads abnormal operation of FPGA when the test system power on. Therefore, this thesis discuss the reliability of FPGA integrated circuits power supply and present two solutions. By changing the LM317 adjustable capacitor ,and the capacitor of the reducing high frequence and the transient response of load circuits to improve power supply reliability function. In the last, this paper compared the both methods and testify their feasibility.
出处
《计算机测量与控制》
北大核心
2013年第2期430-432,447,共4页
Computer Measurement &Control
基金
国家自然科学基金资助项目(60871041)
