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模拟电路性能退化型故障诊断方法研究 被引量:10

Research on degraded fault diagnosis method for analog circuit
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摘要 为了研究线性模拟电路的性能退化型故障诊断问题,通过构造比较电路,提出了一种基于节点电压灵敏度分析的故障字典建立方法,并结合网络撕裂法实现了多个故障元件的定位和故障参数的辨识。测量可及测试点的电压,计算原电路和比较电路的电压增量之比即可定位故障元件,求解节点电压增量方程可得到故障元件的参数漂移量。仿真结果表明,故障参数辨识的平均误差为7.76%,验证了本方法的有效性。 To diagnosis degraded fault for linear analog circuits, through constructing a comparison circuit, a new fault dictionary based on voltage sensitivity analysis of node is established. Then fault localization and fault parameter identifi- cation are realized for multiple faults case. The fault components can be localized and identified by analyzing the voltages of available test-points. The simulation results demonstrate that the average error of fault parameter identification is 7.76%, and the effectiveness of the proposed approach is verified.
出处 《电子测量与仪器学报》 CSCD 2013年第1期32-37,共6页 Journal of Electronic Measurement and Instrumentation
基金 国家自然科学基金(61004074 61134001)资助项目
关键词 模拟电路 故障诊断 灵敏度 网络撕裂法 性能退化 analog circuit fault diagnosis sensitivity decomposition method degradation
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参考文献16

  • 1BERKOWITZ R. Condition for network-element-value solvability ire transaction on circuits theory[J].1962,(09):25-29. 被引量:1
  • 2LI F,WOO P Y. The invariance of node-voltage sensitivity sequence and its application in a unified fault detection dictionary method[J].IEEE Transactions on Circuits and Systems Part I:Fundamental theory and Applications,1999,(10):1222-1227. 被引量:1
  • 3PRASAD V C,BABU N SARAT CHANDRA. Selection of test nodes for analog fault diagnosis in dictionary approach[J].IEEE Transactions on Instrumentation and Measurement,2000,(06):1289-1297.doi:10.1109/19.893273. 被引量:1
  • 4ALIPPI C,CATELANI M,FORT A,MUQUAINI M. SBT soft fault diagnosis in analog electronic circuits:a sensitivity-based approach by randomized algorithms[J].IEEE Transactions on Instrumentation and Measurement,2002,(05):1116-1125. 被引量:1
  • 5李焱骏,陈世杰,王厚军,师奕兵.电压灵敏度向量在模拟电路故障诊断中的应用[J].电子测量与仪器学报,2009,23(6):29-33. 被引量:5
  • 6邹晓松,罗先觉.一种基于多频灵敏度分析的模拟电路K故障诊断方法[J].微电子学与计算机,2005,22(3):140-143. 被引量:4
  • 7安群香,谢平阳.大规模容差模拟电路多故障诊断法[J].电子测量技术,2007,30(2):78-80. 被引量:5
  • 8周龙甫,师奕兵,赵光,唐红.容差条件下模拟电路软故障的数学规划诊断方法[J].电子测量与仪器学报,2010,24(3):237-243. 被引量:8
  • 9TADEUSIEWICZ M,HALGAS S,KORZYBSKI M. An algorithm for soft-fault diagnosis of linear and nonlinear circuits[J].IEEE Transactions on Circuits and Systems Part I:Fundamental theory and Applications,2002,(49):1648-1653. 被引量:1
  • 10TADEUSIEWICZ M,HALGAS S,KORZYBSKI M. Multiple catastrophic fault diagnosis of analog circuits considering the component tolerances[J].International Journal of Circuit theory and Applications,2011. 被引量:1

二级参考文献59

  • 1汪鹏,杨士元.基于斜率故障模型的模拟电路软故障字典法[J].微计算机信息,2006,22(11S):1-2. 被引量:22
  • 2罗明刚,李一民,曾素娣.基于Adaboost算法的人脸检测研究[J].计算机与数字工程,2007,35(2):7-8. 被引量:10
  • 3BANDLER J W, SALAMA A E. Fault diagnosis of analog circuits [J]. Proceedings of the IEEE, 1985, 73(8): 1279- 1325. 被引量:1
  • 4LIU R W. Analog fault diagnosis - A new circuit theory [J]. Proc. 1983 IEEE International Symposium on Circuits and Systems, May 1983: 931-939. 被引量:1
  • 5LI F, WOO E Y. The invariance of node-voltage sensitivity sequence and its application in a unified fault detection dictionary method [J]. IEEE Transaction on Circuits and Systems-Ⅰ: Fundamental Theory and Applications, 1999, 46(10): 1222-1227. 被引量:1
  • 6WANG E YANG, SHY. A new diagnosis approach for handling tolerance in analog and mixed-signal circuits by using fuzzy math [J]. IEEE Transaction on Circuits and Systems Ⅰ: Regular Papers, 2005, 52(10): 2118-2127. 被引量:1
  • 7HE Y, SUN Y. Neural network-based L1-norm optimization approach for fault diagnosis of nonlinear circuits with tolerance [J]. IEE Proc.-Circuit Devices Syst., August 2001,148(4): 223-228. 被引量:1
  • 8AMINIAN M, AMINIAN F. A modular fault-diagnostic system for analog electronic circuits using neural networks with wavelet transform as a preprocessor [J].IEEE transactions on instrumentation and measurement, 2007, 56(5): 1546-1554. 被引量:1
  • 9KAMINSKA B, ARABI K, BELL I,et al. Analog and mixed-signal benchmark circuits - first release [J]. IEEE International Test Conference, 1997. Proceedings, 1997: 183-190. 被引量:1
  • 10BANDLER J W,SALAMA A E.Fault diagnosis of analog circuits[C].Proceedings of the IEEE,1985,73,(8):1279-1325. 被引量:1

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