摘要
在工农业生产、科学实验等领域都广泛应用到二水平部分因子设计.最近,在构造二水平部分因子设计时一种称为doubling的方法被使用.特别是在构造分辨度为IV的设计时,doubling是非常简单但很实用的方法.本文利用对称化L2-偏差作为均匀性的测度,得到了double设计D(X)的对称化L2-偏差值与初始设计X的广义字长型之间的关系.利用上述关系,我们断定对于具有广义较小低阶混杂的初始设计X,其对应的double设计D(X)也应该具有较小的对称化L2-偏差值,也就是说,D(X)应该具有较好的均匀性.
Two-level fractional factorial designs have been widely used in industry,agriculture and scientific experiments.For constructing two-level fractional factorial designs,a method called doubling has been recently used.In particular,in constructing those of resolution IV,doubling is a simple but very powerful method.In this paper,we use the symmetric L2-discrepancy as the measure of uniformity,obtain result connecting the symmetric L2-discrepancy of D(X) and the generalized wordlength pattern of X.We conclude that if X has less generalized aberration,then D(X) has lower symmetric L2-discrepancy,i.e.,D(X) has better uniformity.
出处
《江苏教育学院学报（自然科学版）》
2012年第4期14-15,92,共2页
Journal of Jiangsu Institute of Education(Social Science)
基金
国家自然科学基金(项目编号:No.10671080)
