摘要
针对大量芯片测试的实时管理问题,提出一种测试系统,将测试工作拆分为模块,分步骤、分阶段对芯片测试管理、状态监控采用摘要和层次化的处理,给出测试工作流程和数据结构。实验结果表明,该方法产生测试数据少、时间消耗小,能够有效解决大规模芯片测试的实时问题。
In order to realize real-time management of large scale chips test, this paper introduces a testing system, divides the testing work into modules and manages the chip test according to processes and phases, realizes summary and hierarchical state monitoring. Experimental result shows that the algorithm has the characteristics of less producing test data and time consumption to effectively solve the real-time test problem of large scale chip.
出处
《计算机工程》
CAS
CSCD
2012年第16期233-236,共4页
Computer Engineering
基金
"核高基"重大专项(2011ZX01039-001-002)
关键词
大规模芯片
测试系统
模块
统计
测试管理
状态监控
large scale chip
test system
module
statistics
test management
state monitoring
