摘要
拟定了BeO中12种痕量杂质元素的X-射线荧光光谱测定方法．采用光谱纯试剂人工合成校准标样，粉末压块法制备分析样片。考虑到BeO对X射线的透明性，在样片与样品盒支架之间垫置钼片消除试样盒发射线的干扰并产生附加激发以提高灵敏度。本文分析结果与等离子发射光谱和原子吸收光谱对照相吻合。
X-ray fluorescence spectrometry was applied to the determination of 12 impurity elements in BeO.Calibration standards were manually synthesized from spectral-pure reagents and analytical sample discs were prepared by powder-briqueting.Considering the transparency of BeO to X-ray, a molybdenum pad was laid between the sample disc and the sample supporter of a sample holder to eliminate the interference of spectrum from the sample holder and to produce additional emission for increasing sensitivity.The results analyzed by this method were in good agreement wity those obtained by inductively coupled plasma-atomic emission spectroscopy and atomic absorption spectroscopy.
出处
《分析化学》
SCIE
EI
CAS
CSCD
北大核心
2000年第6期756-758,共3页
Chinese Journal of Analytical Chemistry
基金
国防科工委"九.五"共性研究项目
关键词
X-射线荧光光谱
氧化铍
杂质测定
陶瓷
X-ray fluorescence spectrometry, beryllium oxide,impurity determination
