摘要
将正交投影分辨 (OPR)技术用于多波长色谱重叠峰分辨 ,当色谱峰中最大重叠度小于或等于波长数时 ,用这一方法能从多波长色谱重叠峰中获得完全真解。基于双波长色谱分析 ,提出了一种新的色谱重叠峰中背景校正、组分数和纯组分信号区确定以及各组分重叠情况的分析方法 ,即双波长特征信息分析 (DWCI)。该法被成功的用于三组分双峰和双组分单峰重叠色谱的分析。
Orthogonal projection resolution(OPR) has been proved to be a high performance chromatographic data processing technique.In this paper,it is applied to the resolution of multi-wavelength chromatographic overlapping peaks. When the highest number of degree of overlapping in chromatogram is less than or equal to the number of wavelengths used, a real resolved chromatogram can be completely obtained from multi-wavelength chromatographic overlapping peaks by this method. When based on dual wavelength chromatographic data analysis, a new method, namely dual wavelength characteristic information analysis(DWCI), used for the base line correction, determination of number of components and region of pure components signal. Analysis of overlapping cases of every components in the overlapping chromatogram is also proposed.DWCI has been successfully used for the analysis of overlapping chromatogram with dual peaks of three components and with single peak of two components. But based on single wavelength chromatographic data, the analysis of these overlapping peaks is a very difficult and complicated problem.
出处
《色谱》
CAS
CSCD
北大核心
2000年第2期100-103,共4页
Chinese Journal of Chromatography
基金
湖南省教委青年骨干教师和怀化师范高等专科学校教授基金
关键词
多波长色谱
正交投影
重叠峰分辨
色谱分析
multi-wavelength chromatogram
orthogonal projection
resolution of overlapping peaks
dual wavelength characteristic information analysis
