摘要
可编程逻辑器件(PLD)在电子设备中广泛应用,其安全缺陷检测已成为信息安全领域中一个富有挑战性的课题。通过分析PLD安全缺陷的存在形式,提出了基于状态转移图的安全缺陷检测方法。该方法统一了检测思路,采用了脱机式芯片逆向分析和在线式芯片逆向分析相结合的技术,适用于不同的PLD安全缺陷检测,同时根据存在形式提出了检测算法。最后通过模拟测试对该检测思路及算法的有效性进行了验证。
Due to the wide application of PLD in the electronic devices,the vulnerability detection of PLD has become a challenging subject in the information security field.By analyzing the existence form of PLD security vulnerability,a security vulnerability detection method was proposed,based on state transition diagram.Using off-line reverse analysis and on-system reverse analysis technology,this method unifies the detection ideas,which is suitable for different PLD security vulnerability detection.Then the detection algorithms were proposed on the basis of the existence forms.Finally,the effectiveness of the detection ideas and algorithms were verified by simulation.
出处
《计算机科学》
CSCD
北大核心
2012年第5期53-56,79,共5页
Computer Science
基金
国家863目标导向项目(2009AA01Z434)资助
关键词
可编程逻辑器件
状态转移图
安全缺陷检测
Programmable logic device
State transition diagram
Security vulnerability detection
