摘要
导波光学方法能够用来测量光学薄膜的特征参数,但通常只在单一波长条件下进行。本文将这种方法推广应用到一定光谱范围内的测量,从而研究薄膜材料的色散特性。
The guided wave optical method can be applied to measurement of characteristic parameters of optical thin films, but usually can only be carried out under the conditions of single wavelength. This method can be spread to the measurement of certain spectral range to investigate the chromatic dispersion characterstics of thin films.
出处
《光学工程》
CSCD
1989年第6期23-27,共5页
