摘要
利用北京同步辐射白光形貌术和同步辐射荧光分析对天然金刚石包体进行了研究，结果发现，晶体中存在有很多极细小的包体及大量位错，文中对包体进行分析，并确定出因其产生的位错的特征量。
The inclusions in natural diamond are studied by synchrotron radiation white light topography and fluorescent analysis.The experimental results show that,there are several defects such as much tiny inclusion and a large number of dislocation.Some of the inclusions have been studied,and the characteristic vectors of the dislocation from the inclusions have been determined.
出处
《功能材料》
EI
CAS
CSCD
北大核心
1999年第6期655-656,共2页
Journal of Functional Materials
关键词
天然金刚石
同步辐射
白光形貌术
荧光分析
包体
位错
natural diamond
synchrotron radiation
white-light topography
fluorescent analysis
inclusion
dislocation
