摘要
ＳＥＭＩＰＳ１０ 型图像分析仪系统可以自动、准确地测量晶体等目标的尺寸，对大量测量数据进行统计计算，求出平均直径、标准偏差等，并绘制晶体粒径分布直方图。
Using SEM IPS10 image analyzer ,the crystal size of periclase can be determined automatically and accurately.A large number of data are obtained and a histogram with the statistics including maximum value ,minimum value,mean value and standard deviation value and so on can be given.
出处
《耐火材料》
CAS
北大核心
1999年第5期284-285,共2页
Refractories
