摘要
为降低BIST测试功耗,采用一种改进的二进制粒子群算法对LFSR种子进行优选,使测试图形的长度得到减小进而降低了测试功耗;以ISCAS’85 benchmark电路作为测试对象,同时用粒子群算法和模拟退火算法进行实验,通过对比结果证明了该方法简单有效,可以在不增加硬件开销的情况下大幅度降低BIST测试功耗。
In order to reduce the power of testing for BIST, we used an improved binary particle swarm optimization to select LFSR＇ s seeds. By this way, it can make test vectors fewer and low the power of testing. At last, we used circuits in ISCAS＇89 bench-mark as unit under test. And we do experiment by using particle swarm optimization and simulated annealing algorithm. The result of this experiment proves that this method is easy and can reduce the testing power without additional hardware.
出处
《弹箭与制导学报》
CSCD
北大核心
2011年第1期78-80,共3页
Journal of Projectiles,Rockets,Missiles and Guidance
