摘要
分析了合肥800MeV电子储存环单束团运行模式下影响直流流强检测器（DCCT）的机理，并提出了几种改进措施。采用了增加陶瓷狭缝电容的措施，保证了DCCT在单束团工作模式下的正常工作，并给出了测试结果。
The mechanism of affecting DC current transformer(DCCT) is analyzed for Hefei 800 MeV electronic storage ring under single bunch operation. The several methods of improving DCCT are presented. The method of increasing ceramic gap capacitance is used, which ensure DCCT operate well under single bunch operation. The measurement results are given.
出处
《原子能科学技术》
EI
CAS
CSCD
北大核心
1999年第5期404-409,共6页
Atomic Energy Science and Technology
关键词
单束团
直流流强检测器
壁电流
束流
储存环
Single bunch
DC current transformer
Wall current
Ceramic gap capacitance
