期刊文献+

纳米硫化镉的原位高压阻抗谱研究

In-situ Impedance Spectroscopy Measurement of CdS Nanocrystals under High Pressure
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摘要 利用在金刚石对顶砧上集成微电路,在0~25 GPa内原位测量了平均尺寸为100 nm的硫化镉的阻抗谱.研究表明:阻抗谱在压力下的改变对应着纤锌矿到岩盐矿的相变;在高压力作用下,晶界的散射作用变弱并导致晶界电阻下降. In-situ high-pressure impedance spectroscopy of CdS nanocrystals was measured with diamond anvil cell(DAC) which equipped with microcircuit up to 25 GPa.The change in complex impedance related to the phase transition from wurtzite to rock salt was observed.The results show that the effective scattering section of the grain boundary to charge carriers can be weakened under compression,which leads to the decrease of grain boundary resistance.
出处 《延边大学学报(自然科学版)》 CAS 2010年第4期309-312,共4页 Journal of Yanbian University(Natural Science Edition)
基金 国家自然科学基金资助项目(50772041 50772043 10874053 11074094 50802033)
关键词 高压 阻抗谱 纳米硫化镉 high pressure impedance spectroscopy CdS nanocrystals
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参考文献18

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