摘要
应用X射线荧光光谱法测定了耐指纹板有机涂层中二氧化硅的含量。在所用的校准样品和测试样品的基板成分相同和所用的有机涂层属同类的前提下,可采用经验系数法进行校正。应用此方法对已知二氧化硅含量的耐指纹板样品(二氧化硅量为76.65 mg.m-2)进行12次测定,测得二氧化硅含量的平均值为76.66 mg.m-2,其相对标准偏差为0.087%。
XRFS was applied to the determination of SiO2 in organic coating of fingerprint proof board.The empirical coefficient method was used for correction in the XRFS analysis under the prerequisite of same composition of the base board material and same category of the organic coating material in both the standard sample and the testing sample.The proposed method was applied to the analysis of a known sample of fingerprint proof board（with known SiO2 content of 76.65 mg·m-2）,giving results of average SiO2 content 76.66 mg·m-2 and value of RSD（n=12） 0.087%.
出处
《理化检验（化学分册）》
CAS
CSCD
北大核心
2010年第10期1205-1206,1210,共3页
Physical Testing and Chemical Analysis(Part B:Chemical Analysis)
