摘要
本文将光谱分析技术引入硅基微环延迟线的时间延迟的测量中.基于双正交光谱干涉光路得到TE模式和TM模式的干涉光谱.通过分析测量光谱,获得硅基微环延迟线的输出光场的相位信息,并由此得到时间延迟.
Spectrum analysis technique is introduced to measure the time delay of silicon-based microring delay line. The interference spectra of TE polarization and TM polarization are obtained based on dual-quadrature spectral interferometry technique. By analyzing the observed spectral interference, the phase and time delay of the output optical signal of microring is obtained.
出处
《中央民族大学学报（自然科学版）》
2010年第3期44-47,共4页
Journal of Minzu University of China(Natural Sciences Edition)
关键词
硅基微环
延迟
光谱分析
silicon-based microring
time delay
spectrum analysis
