摘要
对不同杂质含量的高纯铝锭按特定生产工艺得到高压阳极软态光箔和腐蚀箔。采用Ｘ射线衍射法测得板面晶面衍射强度，蚀坑法显示晶粒取向形貌，采用极图、取向分布函数（ＯＤＦ）研究晶粒取向及其分布情况。研究了铝箔再结晶织构随Ｆｅ等杂质含量的变化，分析了Ｆｅ杂质元素对铝箔再结晶行为的影响。借助扫描电镜观察箔材腐蚀坑形貌，并分析沿不均匀的亮区、暗区成分的分布。研究结果表明：铝箔的再结晶织构主要由立方织构｛１００｝〈００１〉及Ｒ织构｛１２４｝〈２１１〉构成，两者的相对强弱随Ｆｅ等杂质含量有规律地变化。铝箔的比电容随立方织构的增加而增加。铝箔的再结晶行为及腐蚀性能受Ｆｅ等杂质含量与分布的控制。这些研究结果为探索高压阳极电容铝箔的最佳Ｆｅ等杂质含量范围、制定最佳生产工艺，获得高比例的立方织构（＞８８％）和高比电容（＞１．０μＦ／ｃｍ２。
High pure aluminium (>99.99%)
foils were investigated for the effects of Fe impurity (1～4)×10 -5 on the recrystallization
textures by means of X ray diffraction, pits etching. The pole figures were measured and
ODF’s were also calculated by Bunge method . The specific capacitances of the studied
foils were determined as well. It was shown that with decreasing of Fe content cube texture in
the foils increases, while R texture decreases, the specific capacitance of the foils increases
with cube texture. By systematic investigation of the influence of Fe content on the
recrystallization textures, it was derived that cube texture dominated (≥88 volume fraction) and
the microstructure was homogeneous much more if the contents of the element Fe were smaller
than the limit (about 10 -5 ), which would be caused by Fe content for from equilibrium
staturation and no precipitates formed during the recrystallization annealing. It was also
showed that the inhomogeneities of compositions and microstructure in the foils often occurred
if the segregation of Fe came into being before the recrystallization.
出处
《中国有色金属学报》
EI
CAS
CSCD
北大核心
1999年第1期19-24,共6页
The Chinese Journal of Nonferrous Metals
关键词
立方织构
再结晶
比电容
铝箔
电容器
铁杂质
capacitor
aluminium foil high pure aluminium cube texuture recrystallization specific capacitance
