摘要
通过x射线衍射方法研究了聚晶金刚石复合片中金刚石层内的宏观残余应力以及微观残余应力.宏观残余应力通过测量x射线衍射的峰值移动可以计算出来,微观残余应力由x射线衍射的峰形宽化决定.本文研究结果表明:我们研究的三种型号聚晶金刚石复合片中存在着宏观残余压应力和微观残余张应力,并且发现宏观残余压应力和微观残余张应力的大小随着金刚石平均粒径的增大而减小,根据x射线衍射研究表明这可能是由于随着金刚石粒径的增大,聚晶金刚石复合片中金刚石相的减少而非金刚石相的增加造成的.x射线衍射技术可以非破坏性的测量宏观和微观残余应力的大小,因此,这是一种很好的检测聚晶金刚石复合片中残余应力的方法,并可以通过应力的大小来优化聚晶金刚石复合片的最佳组分和工艺,同时也可以给出聚晶金刚石复合片的最佳工作条件.
The macro and micro residual stress of diamond layer in Polycrystalline diamond compact was investigated using x-ray diffraction （XRD）. Macro-stress is measured by the XRD peak shifting and micro-stress could be determined using peak broadening. The results show that the compressive macrostress and tensile micro-stress in the layers decreased with the average size of diamond particles increasing, which may be due to decreasing diamond phase content and increasing the non-diamond phases con- tent as estimated from XRD. As the XRD technique can measure macro as well as micro-stress nondestructively,it is a good way to estimate the stress and optimize the optimum formula and process or present the optimum operating condition for PDC.
出处
《原子与分子物理学报》
CAS
CSCD
北大核心
2010年第3期545-550,共6页
Journal of Atomic and Molecular Physics
基金
国家自然科学基金(50572067)
关键词
聚晶金刚石复合片
X射线衍射
宏观应力
微观应力
polycrystalline diamond compact, X-ray diffraction, macro-stress, micro-stress
