摘要
文中针对最后一级采用４位ＣＬＡ加法器级联的Ｍ×Ｎ位ＣＳＡ／ＣＬＡ阵列乘法器，讨论了一种非常有效的测试生成方法．该方法不依赖于乘法器的大小以及乘法器基本单元内部的具体实现结构，与前人的工作相比，缩短了测试时间．对于上述结构的ＣＳＡ／ＣＬＡ阵列乘法器，使用２８个测试矢量即可得到１００％的故障覆盖率．采用文中给出的测试矢量构造ＣＳＡ／ＣＬＡ阵列乘法器的ＢＩＳＴ电路不需要改变乘法器的结构，因此对乘法器的正常工作性能几乎没有任何影响．
An effective test generation method for M×N CSA/CLA array multiplier with a 4 bits CLA chain as its final stage is presented in the paper. This method is independent of the size of multiplier and the concrete implementation of its basic cell. Compared with the previous work, the time for test is shortened and 28 test patterns are enough to ensure 100% fault coverage. Based on these patterns given,it is unnecessary to modify the structure of its basic cell as usual when building BIST circuit for such multiplier, so there is no degradation in the normal function of the multiplier.
出处
《计算机研究与发展》
EI
CSCD
北大核心
1999年第1期118-123,共6页
Journal of Computer Research and Development
关键词
测试生成
阵列乘法器
CLA
CSA
乘法器
test pattern generation, exhaustive testing, array multipliers, CLA
