摘要
为改善北师大外束PIXE系统对Al、Si等较轻元素的探测限,在该系统探测器前加装进He装置。采用美国MicroMatter公司的标准样品,在进He量为92.0 SCCM(标况毫升每分钟)的条件下对系统进行刻度,得到GUPIXWIN软件进行定量分析用的16种元素的刻度因子,并同不进He条件下的刻度因子进行比较。在保持实验几何条件不变的情况下,研究He气量对大气颗粒物样品中Si、S、Cl等元素探测限的影响,结果表明:进He量为92.0 SCCM时,可使大气颗粒物样品中Al、Si元素的探测限较不进He气时分别降低80%和47%。
A He flow instrument is introduced to improve the limit of detection of light elements as Al and Si in an external beam PIXE system in the Beijing Normal University. With standard samples made by the MicroMatter company, scale factors for GUPIXWIN quantitative analysis in the condition of 92.0 SCCM He flow are obtained and compared with factors without He flow. Maintaining the same experimental geometry, the effect of He flow on the limit of detection of Si, S, Cl elements in an atmospheric particulate sample is studied. The results show that the limit of detection of Al and Si with 92.0 SCCM He flow is reduced by 80% and 47% compared to the limit without He.
出处
《现代仪器》
2010年第1期55-57,48,共4页
Modern Instruments
关键词
外束PIXE
He气
大气颗粒物
探测限
External beam PIXE Helium flow Atmospheric particulates Limit of detection
