摘要
The binary decision diagrams （BDDs） can give canonical representation to Boolean functions; they have wide applications in the design and verification of digital systems. A new method based on cultural algorithms for minimizing the size of BDDs is presented in this paper. First of all, the coding of an individual representing a BDDs is given, and the fitness of an individual is defined. The population is built by a set of the individuals. Second, the implementations based on cultural algorithms for the minimization of BDDs, i.e., the designs of belief space and population space, and the designs of acceptance function and influence function, are given in detail. Third, the fault detection approaches using BDDs for digital circuits are studied. A new method for the detection of crosstalk faults by using BDDs is presented. Experimental results on a number of digital circuits show that the BDDs with small number of nodes can be obtained by the method proposed in this paper, and all test vectors of a fault in digital circuits can also be produced.
The binary decision diagrams （BDDs） can give canonical representation to Boolean functions; they have wide applications in the design and verification of digital systems. A new method based on cultural algorithms for minimizing the size of BDDs is presented in this paper. First of all, the coding of an individual representing a BDDs is given, and the fitness of an individual is defined. The population is built by a set of the individuals. Second, the implementations based on cultural algorithms for the minimization of BDDs, i.e., the designs of belief space and population space, and the designs of acceptance function and influence function, are given in detail. Third, the fault detection approaches using BDDs for digital circuits are studied. A new method for the detection of crosstalk faults by using BDDs is presented. Experimental results on a number of digital circuits show that the BDDs with small number of nodes can be obtained by the method proposed in this paper, and all test vectors of a fault in digital circuits can also be produced.
基金
supported by Natural Science Foundation of Guangdong Provincial of China (No.7005833)
