1Grigorescu S E,Petkov N,Kruizinga P.Comparison of texture features based on gabor filters[].IEEE Transactions on Image Processing.2002 被引量：1
2P.R.Bingham,J.R.Price,K.W.Tobin,T.R.Karnowski.＂Semiconductor sidewall shape cstimation＂[].Journal of Electrocardiology.2004 被引量：1
3Price Jeffery R,Bingham Philip R,Tobin Jr, etc.Estimating cross-section semiconductor structure by comparing top-down SEM images[].Proceedings of SPIE-Machine Vision Applications in Industrial Inspection XI.2003 被引量：1
