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基于AHP与D-S理论的辐射源识别技术 被引量:4

Emitter Recognition Technology Based on Analytic Hierarchy Process and D-S Theory
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摘要 深入研究了基于层次分析与证据理论的辐射源识别技术。首先针对属性测度识别方法中权重获取困难的问题,提出利用层次分析法获取多参数权重的思想,给出权重具体计算步骤,同时简要回顾属性测度识别方法的原理。在此基础上,应用D-S证据理论进行多传感器信息融合,给出识别算法和模型。仿真对比实验表明,提出的辐射源识别技术是实用有效的,其正确识别率较高。 Emitter recognition technology based on Analytic Hierarchy Process is deeply discussed in this paper. First, aim at the difficult problem of extracting parameters weights, a new idea to calculate the parameters weights with AHP is proposed, calculating steps is list and the attribute measure recognition principle is reviewed simultaneously. Second, the paper introduces the multi-sensor data fusion method based on the Dempster-Shafer evidence theory, this paper recognition algorithm is list and recognition model is given. Finally, contrast experiments indicate that the proposed method is effective in emitter recognition and accurate recognition rate is high obviously.
出处 《宇航学报》 EI CAS CSCD 北大核心 2009年第6期2317-2321,共5页 Journal of Astronautics
关键词 层次分析 辐射源识别 属性测度 D-S理论 AHP Emitter recognition Attribute measure Dempster-shafer theory
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