摘要
采用氧瓶燃烧法对电子元器件样品进行燃烧,用碳酸钠作为吸收液进行吸收,离子色谱法分离测定微量卤素离子。选择的色谱条件为:IonPac AS22离子交换柱,碳酸盐等度淋洗,抑制型电导检测。对色谱方法进行了比较详尽的讨论,并给出了判断"假阳性"的一些推荐方法。选定的方法具有灵敏度高、选择性好、操作简单、价格便宜、对环境友好等特点,适合大规模推广使用。
A method for analysis of halogen in electronic components by oxygen bomb-ion chromatography technology was developed. Electronic components were burnt in oxygen bomb and the reaction products were absorbed by Na2 CO3 solution. The chromatographic conditions were studied and optimized as follow： using IonPac AS22 anion exchange column as separation column, isocratic carbonate/bicarbonate as eluent and suppressed conductivity detector for chromatographic detection. The method provides the features of simple operation, good sensitivity and selectivity, good reproducibility, economic and environmental friendly. The method has been proved to be suitable for determination of halogen content in electronic components.
出处
《岩矿测试》
CAS
CSCD
北大核心
2009年第6期545-548,共4页
Rock and Mineral Analysis
