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基于单片机和LabVIEW的静电电荷衰减测试系统 被引量:2

Charge decay test system based on MCU and LabVIEW
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摘要 针对研制静电电荷衰减测试系统的需要,在研究了LabVIEW8开发环境下数据采集与信号处理的实现方式的基础上,以计算机、单片机和数据采集芯片AD1674为主要硬件,C51和LabVIEW为软件开发平台,构建了用于实现信号的采集与信号分析的测试系统。系统可实现数据的采集,信号分析,以及数据的存储和对历史数据的复现。在降低设备成本的同时,该系统还具有友好的人机界面,并且方便进行维护和实现功能扩充。该系统已应用在实际测试中,充分体现了方便、快捷、实用等诸多优势。 For the development of electrostatic charge decay test system needs, in the study of the LabVIEW 8 development environment data acquisition and signal processing implementations, based on a computer, microcontroller, and data acquisition chip AD1674 as the main hardware, C51 and LabVIEW for software development platform to build for achieving signal acquisition and signal analysis test system. The system can realization data acquisition, signal analysis, data storage and recovery of historical data now. While reducing equipment costs, the system also has a friendly man-machine interface, and facilitates the expansion of safeguarding and realizing the functionality. The system has been applied in the actual test, fully embodies the easy, quick, practical, and many other advantages.
出处 《电子测量技术》 2009年第11期109-111,136,共4页 Electronic Measurement Technology
关键词 单片机 AD1674 LABVIEW 串口通信 静电测试 MCU AD1674 LabVIEW serial communication electrostatic test
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