摘要
提出一种新型的颗粒测量方法，基于Ｍｉｅ散射理论，从另一独特的视角接收大角度的侧向散射光，并建立新的理论模型，可使测量下限扩展，技术要求有所改善。结合目前已经成熟的半导体激光和ＣＣＤ技术，运用此原理可使颗粒测量仪器向更轻便。
This paper puts forward a method based on Mie scattering theory, which detects the lateral scattering light from a new view point. A novel theoretical calculation model is established. According to this principle the measuring range of particle sizes is extended while technical requirements are reduced. Combining with mature semiconductor lasers and the CCD image technique, this method will make the particle sizer portable and more sensitive.
出处
《中国激光》
EI
CAS
CSCD
北大核心
1998年第11期1040-1044,共5页
Chinese Journal of Lasers
关键词
侧向散射
粒径分布
条形阵列
光敏二极管
Mie theory, lateral scattering, particle size distribution, imaging sensor
