摘要
研究了采用四引线法测量Bi2223/Ag带材的Ic和n值时,电压引线距离对测量结果的影响。实验结果表明,对于同一根Bi2223/Ag带材,在不同的电压引线距离下,采用四引线法测得的Ic和n值(尤其是最小值)结果不同;n值弱点对带材端对端n值的影响比Ic弱点对带材端对端Ic的影响更大;对于百米量级的长带,通过测量带材端对端以及抽样短样的Ic和n值,很难检测出弱点,必须采用四引线法在较小的电压引线距离下逐段检测或者采用非接触连续磁测法进行检测。
Effect of voltage tap distance on four-probe method measurement results of critical current and n value of Bi2223/Ag tapes was investigated. The experimental results indicate that critical currents and n values, especially the minima, of the same tape exhibit variation under different voltage tap distances. And n values of weak points have more influence on the end-to-end n value of the whole tape than critical currents of weak points on the end-to-end critical current of the whole tape. Furthermore, in order to detect weak points of the Bi2223/Ag tapes with a length of several hundred meters, it＇s not feasible by just testing the end-to-end critical currents and n values of the whole tape and those of short samples, while four-probe method at a small voltage tap distance point-by-point or the contact-free continuous magnetic measurement method should be employed.
出处
《稀有金属材料与工程》
SCIE
EI
CAS
CSCD
北大核心
2008年第A04期416-419,共4页
Rare Metal Materials and Engineering
基金
国家高技术研究发展计划(863计划)项目(2006AA03Z206)
