摘要
针对零件二维几何尺寸的高精度非接触测量问题,提出了基于线阵CCD扫描测量的方法。通过对扫描同步的分析,很好地控制了扫描图像的失真。对CCD扫描图像设计了处理算法。由于需布置光源,而光源随时间会有所衰减,所以对图像采用边缘检测的算法,以减小光源亮度变化对图像测量的影响;由于获取的梯度是梯度带,同时为了不加剧边缘的不连续性,采用了细化算法。对间断点进行插值,采用周长法计算直径,系统测量结果与采用千分尺进行测量的结果相比较,其测量误差不大于10μm。
A linear array CCD scanning measurement method is proposed for high-precision non-contact measurement of the two-dimensional geometry; through the analysis of synchronization scanning, it has a very good control for the scanned image distortion. A processing algorithm is designed. Because of the light arranged that will be attenuated over time, the edge detection algorithm is used to reduce the impact that from the light changing. For the gradient zone, in order to not to aggravate the edge discontinuities, the thinning algorithm is used. Comparing the system measurement results with the result by micrometer, the measurement error is less than 10 μm.
出处
《山西电子技术》
2009年第5期36-38,共3页
Shanxi Electronic Technology
关键词
线阵CCD
测量系统
扫描同步控制
图像处理
二维尺寸
linear array CCD
measuring system
scanning synchronization control
image processing
two-dimensional size
