摘要
利用光学特征矩阵方法,研究了含负折射率缺陷的正负折射率交替一维光子晶体缺陷模的相关特性。研究表明当缺陷层的光学厚度不变时,随着缺陷层折射率的增加,分布在禁带中心两侧的缺陷模分别向临近的禁带边缘方向移动,并与透射谱形成连续的透射带,随着折射率的增加,透射带的透射率逐渐增加,其半高宽度逐渐减小;而当缺陷层折射率不变时,随着缺陷层的光学厚度增加,缺陷模向长波方向平移,同时缺陷模的个数也随之增加,而由缺陷模和透射谱连成的透射带的带宽逐渐减小。与正折射率缺陷情形相比较,负折射率缺陷层可以获得更多的缺陷膜。
Defect mode in positive- negative index photonic crystal with negative befractive index structural defect are studied by using characteristic matrix method. It is found that the FWHM of defect mode and the transmissivity of the transmission band are increased and the defect mode move to long wavelengths with the increase of dope＇ s refractive index when the optics thickness dose not change of dope＇ s. That the number of defect mode is reduced and the FWHM of defect mode is decreased with the increase ef the dope＇ s optics thickness when the dope＇ s refractive index is invariable. By contrast with positive refractive index structural defect, the structure could get more defect mode.
出处
《激光杂志》
CAS
CSCD
北大核心
2009年第5期42-43,共2页
Laser Journal
基金
重庆市教委科技项目基金(KJ080720)
关键词
光子晶体
缺陷模
特征矩阵
负折射率材料
photonic crystal
defect mode
characteristic matrix
negative refractive index material
