摘要
机内测试(built-in test,BIT)可以提高机载电子设备的任务可靠性,提升装备系统的任务效能。按照基于可靠性的BIT优化设计思想,分析了BIT对系统可靠性的影响,重点讨论了基于可靠性的BIT优化设计方法。提出了BIT优化设计的非线性整数规划(non-linear integer programming,NLIP)模型,并通过LINGO软件求解该模型。实例分析结果表明,该方法有效地降低了系统的故障率,提高了BIT设计指标。
Built-in test （BIT） can improve the mission reliability of the system and enhance the mission effectiveness of equipment systems. The impact of BIT on the system is analyzed according to the BIT optimization design concept based on the reliability, the BIT optimization design methods based on reliability are mainly discussed, the non-linear integer programming （NLIP） model of the BIT optimization design is presented, and the model is calculated by LINGO. The results indicate that the system fault probability is decreased, and the performances of the BIT design are increased effectively by the proposed approach.
出处
《系统工程与电子技术》
EI
CSCD
北大核心
2009年第9期2276-2279,共4页
Systems Engineering and Electronics
基金
国家自然科学基金(60572173)资助课题
关键词
机内测试
可靠性
非线性整数规划模型
优化设计
故障率
built-in test
reliability
non-linear integer programming model
optimization design
fault probability
