期刊文献+

纳米磁性膜微波磁谱测量微带线系统的优化设计 被引量:2

Optimization Design of Microstrip-Line System for Measurement of Permeability Spectrum of Nanostructural Magnetic Film
下载PDF
导出
摘要 磁性薄膜微波磁导率的扫频测量对研究开发高频软磁材料和薄膜吸波材料都具有十分重要的意义.围绕微波磁谱测量微带线系统的优化设计,主要研究微带线短路法测量薄膜磁谱使用的测量夹具的设计与制作.首先根据测试要求确定夹具设计方案,再利用高频电磁场仿真软件HFSS对微带线结构夹具进行性能仿真与设计优化,最后按设计要求制作微带线结构夹具,并对测试效果进行了分析评价.结果表明,设计开发的微带线结构夹具能满足0.05~5GHz频段磁导率的测量精度要求,反射系数S11的测量误差小于1.4%. Measurement of permeability spectrum in the microwave range is essential to the development of soft magnetic film and thin microwave absorber. Focusing on optimization design of microstrip-line system for measurement of microwave permeability spectrum, design and manufacture of the testing clamp used in the microstrip-line short circuit method were discussed in this paper. Design scheme of the testing clamp was put forward firstly. Then, simulation and optimization of the testing clamp were accomplished with the software of HFSS for electromagnetic field emulation in the high frequency range. The testing clamp was processed and evaluated according to requirements of the design. Results show that the testing clamp can meet the measurement precision requirement in 0. 05--5 GHz of the microstrip-line short circuit method with error of reflection coefficient S11 less than 1.4%.
出处 《纳米技术与精密工程》 EI CAS CSCD 2009年第4期333-336,共4页 Nanotechnology and Precision Engineering
基金 国家自然科学基金资助项目(60771028)
关键词 薄膜磁谱 扫频测量 微带线短路法 测量夹具 优化设计 permeability spectrum of film frequency scanning measurement microstrip-line short circuit method testing clamp optimization design
  • 相关文献

参考文献8

  • 1Carter R G. Accm-acy of microwave cavity perturbation measurements [J]. IEEE Trans MTT, 2001, 49(5) : 918- 923. 被引量:1
  • 2张秀成,聂彦,何华辉,江建军.薄膜材料复介电常数与复磁导率测试研究[J].华中科技大学学报(自然科学版),2004,32(4):90-92. 被引量:12
  • 3Thakur K P, Holmes W S. Dielectric constant and loss factor of dielectric material using finite element method in a cavity [C ]//Microwave Conference, 2000 Asia-Pacific. Tokyo, Japan, 2000 : 116-118. 被引量:1
  • 4Baker-Jarvis J , Vanzura E J , Kissick W A. Improved technique for determining complex permittivity and permeability with the transmission / reflection method [ J ]. IEEE Trans MTT, 1990, 38(8): 1096-1103. 被引量:1
  • 5Nicolson A M , Ross G F. Measurement of intrinsic properties of materials by time-domain techniques [ J ]. IEEE Trans lnstr Meas, 1970, 19(4) : 377-382. 被引量:1
  • 6Barry W. A broad-band, automated, stripline technique for simultaneous measurement of complex permittivity and permeability [J]. IEEE Trans MTT, 1986, 34(1) :80-84. 被引量:1
  • 7Yamaguchi M, Acher O, Miyazawa Y, et al. Cross measurement of thin film permeability up to UHF range [ J ]. J Magn Magn Mat, 2002,242/243/244/245:970-972. 被引量:1
  • 8Bekker V, Seemann K, Leiste H. A new strip line broad- band measurement evaluation for determining the complex permeability of thin ferromagnetic films [ J ] . J Magn Magn Mat, 2004,270(3 ) : 327-332. 被引量:1

二级参考文献6

  • 1Fessant A, Gieraltowski J, Loaec J. Influence of in plane anisotropy and eddy currents on the frequency spectra of the complex permeability of amorphous CoZr thin films. IEEE Trans Magn, 1993, 29(1): 82-87. 被引量:1
  • 2Laumo N J, Makovicka T J. Measurement of the permeability of thin film. Review of Scientific Instruments, 1999, 70(4) : 2 072-2 073. 被引量:1
  • 3Daiqing L, Charles F. A simple method for accurate loss tangent measurement of dielectrics using a microwave resonant cavity. IEEE Microwave and Wireless Components Letters, 2001, 11(3): 118-120. 被引量:1
  • 4Yabukami S, Uo T, Yarnaguchi M. High sensitivity permeability measurement of striped films obtained by input impedance. IEEE Trans Magn, 2001, 37(4) :2 776-2 778. 被引量:1
  • 5Yamaguchi M, Acher O, Miyazawa Y. Cross measure ment of thin film permeability Up to UHF range. J Magn Magn Mat, 2002, 242-245:970-972. 被引量:1
  • 6Ida N. Engineering electroma~gnetics. New York: Springer Verlag Inc., 2000. 被引量:1

共引文献11

同被引文献13

引证文献2

二级引证文献5

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部