摘要
A new technique is developed to measure the electrical resistivity of conductor with a nonuniform tem- perature profile. The calculation method is derived from the temperature dependence of the electrical resistivity. The apparatus consists mainly of a high temperature environmental chamber, a power circuit of heating, a twenty-wavelength pyrometer, and a scanning pyrometer. After getting the resistance from the voltage drop of the specimen, the electrical resistivity in a wide temperature range of the specimen can be obtained by our calculation model. Preliminary results of the electrical resistivity of SRM 8424 over a wide temperature range （1000-3000 K） are presented. The perfect consistency between the measurement results and the nominal values justifies the validity of this technique.
A new technique is developed to measure the electrical resistivity of conductor with a nonuniform tem- perature profile. The calculation method is derived from the temperature dependence of the electrical resistivity. The apparatus consists mainly of a high temperature environmental chamber, a power circuit of heating, a twenty-wavelength pyrometer, and a scanning pyrometer. After getting the resistance from the voltage drop of the specimen, the electrical resistivity in a wide temperature range of the specimen can be obtained by our calculation model. Preliminary results of the electrical resistivity of SRM 8424 over a wide temperature range （1000-3000 K） are presented. The perfect consistency between the measurement results and the nominal values justifies the validity of this technique.
基金
supported by the General Armament Department under Grant No. 51312060201
