摘要
为了提高现阶段XLPE电缆料缺陷检测的精度与速度,运用TCD132D芯片,建立了陷检检测系统。该系统在平行光的照射下,通过线阵CCD控制电路获得电缆材料缺陷信号,使用虚拟示波器DSO-2902对缺陷信号进行采集、传输,借助于计算机进行分析处理,从而精准地检测出缺陷;由数据采集系统对计算机内的信号数据进行处理,从而实现对缺陷具体尺寸和所处位置的检测。结果表明:该系统分辨力可达到20μm,误差小于5%,缺陷的检出率达100%。
In order to improve the present accuracy and speed of XLPE cable materials impurity testing, this paper set up the impurity testing system using the TCD132D chip. The inspecting system of defects in cable materials based on CCD obtained signals of defects in cable materials with irradiation of parallel light by computer linear array CCD control circuit. The defect signals were collected and transferred by using virtual oscillograph DSO-2902, and the defect signals were analyzed and processed by computer. The defects were precisely figured out. The data of signals memorized in computer were processed by using software system of data collecting. Thereby, the inspection of precise size and location of defects were achieved. The result shows that the resolving power of this method can reach 20 μm and the error is less than 10%. The possibility that the impurity particles can be checked out is up to 100%.
出处
《仪表技术与传感器》
CSCD
北大核心
2009年第6期73-75,共3页
Instrument Technique and Sensor
基金
国家自然科学基金(50577012)
关键词
线阵CCD
虚拟仪器
缺陷
数据采集
linear CCD
virtual oscillograph
defects
data acquisition
